• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Zhu, Yong-Xin (Zhu, Yong-Xin.) | Li, Xiao-Yan (Li, Xiao-Yan.) | Xiao, Hui (Xiao, Hui.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The intermetallic compound (IMC) play an important role in the electronic packaging, which is a sign of reliable bonding. Nevertheless, thicker IMC layers exert detrimental influence on the bonding reliability for its intrinsic brittleness. Hence, it is meaningful to probe the property of the IMC layers. In this study, technique for testing the IMC property were reviewed and some results were listed, which mainly consisted of the hardness, modulus, yield strength and coefficient of thermal expand, etc.

Keyword:

Intermetallics Soldering alloys Electronics packaging Reviews Fracture mechanics

Author Community:

  • [ 1 ] [Zhu, Yong-Xin]School of Material Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Li, Xiao-Yan]School of Material Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Xiao, Hui]School of Material Science and Engineering, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Journal of Functional Materials

ISSN: 1001-9731

Year: 2013

Issue: 4

Volume: 44

Page: 457-462

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

Online/Total:762/10624259
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.