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Author:

Gao, Xiang (Gao, Xiang.) | Zhang, Yuncheng (Zhang, Yuncheng.) | Xiang, Yanxun (Xiang, Yanxun.) | Li, Peng (Li, Peng.) | Liu, Xiucheng (Liu, Xiucheng.)

Indexed by:

EI Scopus

Abstract:

The accurately and rapidly delineating surface contours is crucial for ultrasonic immersion nondestructive testing (NDT) of complex curved-surface components. However, directly employing ultrasonic signals for interface reconstruction in dual-layer media remains a challenge. In this article, a physics-informed neural network (PINN) is developed for the reconstruction of the interface between water and unknown surface components. By incorporating the nonlinear equations of Fermat's principle as additional constraints in the loss function, a neural network is constructed that is dual driven by both data and physical information. The simulation and experimental results show that the maximum error (ME) of the interface reconstruction by this method is below 0.5 mm, the average relative error (ARE) is less than 1.0%, and the computation time is less than 1 s. The imaging results of V-shaped crack defects using different interface reconstruction methods are further compared, verifying the significant advantages of PINN in ultrasonic array inspection of complex curved components. © 1963-2012 IEEE.

Keyword:

Ultrasonic imaging Ultrasonic testing Bioinformatics Nondestructive examination Cracks Thermography (imaging) Image reconstruction Multilayer neural networks Fracture mechanics

Author Community:

  • [ 1 ] [Gao, Xiang]Beijing University of Technology, School of Information Science and Technology, Beijing; 100021, China
  • [ 2 ] [Zhang, Yuncheng]East China University of Science and Technology, School of Mechanical and Power Engineering, Shanghai; 200237, China
  • [ 3 ] [Xiang, Yanxun]East China University of Science and Technology, School of Mechanical and Power Engineering, Shanghai; 200237, China
  • [ 4 ] [Li, Peng]Beijing University of Technology, School of Information Science and Technology, Beijing; 100021, China
  • [ 5 ] [Liu, Xiucheng]Beijing University of Technology, School of Information Science and Technology, Beijing; 100021, China

Reprint Author's Address:

  • [li, peng]beijing university of technology, school of information science and technology, beijing; 100021, china;;

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Source :

IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2025

Volume: 74

5 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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