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Author:

Gao, Cong (Gao, Cong.) | Yu, Run (Yu, Run.) | Cheng, Xiaopeng (Cheng, Xiaopeng.) | Sun, Tao (Sun, Tao.) | Li, Chengyu (Li, Chengyu.) | Zhou, Xuefeng (Zhou, Xuefeng.) | Wang, Dandan (Wang, Dandan.) | Lou, Chenjie (Lou, Chenjie.) | Mu, Peiyang (Mu, Peiyang.) | Gao, Xiang (Gao, Xiang.) | Yang, Wenge (Yang, Wenge.) | Chao, Dongliang (Chao, Dongliang.) | Chen, Yongjin (Chen, Yongjin.)

Indexed by:

Scopus SCIE

Abstract:

Interface instability between the perovskite Li3xLa2/3-xTiO3 (LLTO) and lithium metal anode limits the application in all-solid-state lithium batteries. Direct contact with lithium metal triggers Ti4+ reduction in crystalline LLTO, including rapid lattice destabilization and performance decay, though the governing mechanisms remain unelucidated. Herein, significant insights from multi-scale characterization technologies and molecular dynamics simulations, reveal the formation of oxygen vacancies in LLTO and lithium oxides at the interface. The mechanical measurements with nanoindentation and Vickers hardness allow us to directly quantify the degradation of hardness and elastic modulus of LLTO. Li|LLTO|Li symmetric cells further confirm the electrochemical decline. We propose a degradation mechanism of the interfacial instability from the perspective of microstructure, mechanical, chemical and electrochemical kinetics. This study provides crucial insights into the microscopic origin to understand the interfacial chemical processes, which is helpful to guide future interface designs.

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Author Community:

  • [ 1 ] [Gao, Cong]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 2 ] [Yu, Run]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 3 ] [Li, Chengyu]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 4 ] [Zhou, Xuefeng]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 5 ] [Wang, Dandan]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 6 ] [Lou, Chenjie]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 7 ] [Mu, Peiyang]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 8 ] [Yang, Wenge]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 9 ] [Chen, Yongjin]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China
  • [ 10 ] [Cheng, Xiaopeng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 11 ] [Sun, Tao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 12 ] [Chao, Dongliang]Fudan Univ, Coll Chem & Mat, Lab Adv Mat, Shanghai Key Lab Mol Catalysis & Innovat Mat, Shanghai 200433, Peoples R China
  • [ 13 ] [Gao, Xiang]Chongqing Talent New Energy Co Ltd, Chongqing 401133, Peoples R China

Reprint Author's Address:

  • [Chen, Yongjin]Ctr High Pressure Sci & Technol Adv Res HPSTAR, Beijing 100193, Peoples R China;;[Gao, Xiang]Chongqing Talent New Energy Co Ltd, Chongqing 401133, Peoples R China

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Source :

JOURNAL OF MATERIALS CHEMISTRY A

ISSN: 2050-7488

Year: 2025

1 1 . 9 0 0

JCR@2022

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SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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