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Author:

Gong, Yanpeng (Gong, Yanpeng.) | Kou, Yuguo (Kou, Yuguo.) | Yue, Qiang (Yue, Qiang.) | Zhuang, Xiaoying (Zhuang, Xiaoying.) | Valizadeh, Navid (Valizadeh, Navid.) | Qin, Fei (Qin, Fei.) | Wang, Qiao (Wang, Qiao.) | Rabczuk, Timon (Rabczuk, Timon.)

Indexed by:

EI Scopus SCIE

Abstract:

Sintered silver paste has emerged as one of the most promising green packaging interconnection materials in electronic packaging due to its combination of low-temperature processing and high-temperature service capabilities. At the microscale, sintered silver exhibits random porous structures influenced by sintering processes, leading to various fracture issues under complex operating conditions, where the mechanical reliability is significantly influenced by thermo-mechanical loading during service. This study establishes a thermo-mechanical coupled phase-field model incorporating mixed tensile-shear failure modes to investigate the mechanical behavior and fracture evolution of random porous structures reconstructed from SEM images of sintered silver. The phase-field approach effectively captures crack initiation and propagation without explicit crack tracking by introducing a regularized description of discontinuities. Numerical predictions of elastic modulus and tensile strength show good agreement with experimental results under various loading conditions, including tensile, shear, and end- notched flexure (ENF) tests. Simulations of crack propagation under thermal and shear loading conditions reveal distinctive crack patterns and complex crack networks. The proposed approach provides an efficient and reliable method for simulating the mechanical behavior and failure mechanisms of sintered silver solder with random porous structures, offering valuable insights for improving electronic package reliability.

Keyword:

Failure mechanism Damage evolution Phase-field modeling Thermomechanical coupling problems Sintered silver

Author Community:

  • [ 1 ] [Gong, Yanpeng]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Kou, Yuguo]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 3 ] [Qin, Fei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 4 ] [Gong, Yanpeng]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany
  • [ 5 ] [Kou, Yuguo]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany
  • [ 6 ] [Yue, Qiang]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany
  • [ 7 ] [Zhuang, Xiaoying]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany
  • [ 8 ] [Valizadeh, Navid]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany
  • [ 9 ] [Zhuang, Xiaoying]Tongji Univ, Coll Civil Engn, Dept Geotech Engn, Shanghai 200092, Peoples R China
  • [ 10 ] [Wang, Qiao]Wuhan Univ, State Key Lab Water Resources Engn & Management, Wuhan 430072, Hubei, Peoples R China
  • [ 11 ] [Rabczuk, Timon]Bauhaus Univ Weimar, Inst Struct Mech, D-99423 Weimar, Germany

Reprint Author's Address:

  • [Gong, Yanpeng]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China;;[Gong, Yanpeng]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany;;[Yue, Qiang]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany;;[Zhuang, Xiaoying]Leibniz Univ Hannover, Inst Photon, Chair Computat Sci & Simulat Technol, Dept Math & Phys, D-30167 Hannover, Germany;;[Zhuang, Xiaoying]Tongji Univ, Coll Civil Engn, Dept Geotech Engn, Shanghai 200092, Peoples R China

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Source :

ENGINEERING FRACTURE MECHANICS

ISSN: 0013-7944

Year: 2025

Volume: 320

5 . 4 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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