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Author:

Tytko, Grzegorz (Tytko, Grzegorz.) | Adamczyk-Habrajska, Malgorzata (Adamczyk-Habrajska, Malgorzata.) | Li, Yong (Li, Yong.) | Liu, Zenghua (Liu, Zenghua.) | Kopec, Mateusz (Kopec, Mateusz.)

Indexed by:

EI Scopus SCIE

Abstract:

This study investigates the use of high-frequency eddy current testing (ECT) to assess the structural integrity of aluminide coatings on MAR-M247 nickel superalloy under simulated fatigue conditions. Aluminide coatings, deposited via chemical vapor deposition at thicknesses of 20 mu m and 40 mu m, were tested using custom-designed probes optimized for defect detection. Results demonstrate that substrate grain structure and coating thickness significantly influence coating durability, with fine-grain substrates exhibiting the least resistance changes and greatest fatigue tolerance. Eddy current signal variations correlated with microstructural changes, enabling detection of damage otherwise invisible to traditional methods. These findings establish ECT as a precise, nondestructive approach for monitoring aluminide coatings in critical applications.

Keyword:

Non-destructive testing Eddy current testing Nickel alloys Aluminide coating

Author Community:

  • [ 1 ] [Tytko, Grzegorz]Silesian Tech Univ, Fac Automat Control Elect & Comp Sci, PL-44100 Gliwice, Poland
  • [ 2 ] [Adamczyk-Habrajska, Malgorzata]Univ Silesia, Fac Sci & Technol, PL-41500 Chorzow, Poland
  • [ 3 ] [Li, Yong]Xi An Jiao Tong Univ, Shaanxi Engn Res Ctr NDT & Struct Integr Evaluat, State Key Lab Strength & Vibrat Mech Struct, Xian, Shaanxi, Peoples R China
  • [ 4 ] [Liu, Zenghua]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Kopec, Mateusz]Polish Acad Sci, Inst Fundamental Technol Res, Pawinskiego 5B, PL-02106 Warsaw, Poland

Reprint Author's Address:

  • [Kopec, Mateusz]Polish Acad Sci, Inst Fundamental Technol Res, Pawinskiego 5B, PL-02106 Warsaw, Poland

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Source :

MEASUREMENT

ISSN: 0263-2241

Year: 2025

Volume: 252

5 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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