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Author:

Xu, Wei (Xu, Wei.) | Leng, Chengcai (Leng, Chengcai.) | Yu, Naigong (Yu, Naigong.) (Scholars:于乃功) | Ruan, Xiaogang (Ruan, Xiaogang.)

Indexed by:

EI Scopus CSCD

Abstract:

This paper proposes a novel equivalence graph cut method based on wavelet transform for SAR image registration in order to improve robustness and real-time performance. First, the equivalence graph cut model is constructed in low-frequency sub-images after wavelet transform of image, which can reduce speckle noise. The proposed model can not only avoid NP-complete problems but also provide a solution to the choice of mapping function. Then, scale invariant feature transform (SIFT) is exploited to find the feature matching in the object accurately segmented from the original image so as to reduce the feature point description of search space and improve real-time performance. Finally, the accurate SAR image registration is achieved based on the transformation parameters found by matching relationship. The experimental results show that the proposed method can achieve fast and accurate image registration.

Keyword:

Synthetic aperture radar Image compression Wavelet transforms Object recognition Radar imaging Computational complexity Image registration Image enhancement Graphic methods

Author Community:

  • [ 1 ] [Xu, Wei]Department of Applied Mathematics, Northwestern Polytechnical University, Xi'an 710129, China
  • [ 2 ] [Leng, Chengcai]Department of Applied Mathematics, Northwestern Polytechnical University, Xi'an 710129, China
  • [ 3 ] [Yu, Naigong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Ruan, Xiaogang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Nanotechnology and Precision Engineering

ISSN: 1672-6030

Year: 2013

Issue: 1

Volume: 11

Page: 14-19

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 18

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