'Smile' effect on the beam quality for diode laser arrays - Details

Author：

Lang, Chao (Lang, Chao.) | Yao, Shun (Yao, Shun.) | Chen, Bingzhen (Chen, Bingzhen.) | Jia, Guannan (Jia, Guannan.) | Wang, Zhiyong (Wang, Zhiyong.) (Scholars：王智勇)

Indexed by：

EI PKU CSCD

Abstract：

By　establishing　the　near-field　and　far-field　models　of　the　diode　laser　arrays　with　the　＇Smile＇　effect,　and　combining　optical　near-field　scanning　method　with　Gaussian　beam　propagation　theory,　the　conclusion　that　the　value　of　＇Smile＇　effect　and　the　distribution　decide　the　beam　quality　of　diode　laser　arrays　together　is　proved　theoretically　and　experimentally.　Except　that,　the　beam　parameters　products　of　diode　laser　arrays　under　different　＇Smile＇　effect　in　the　fast　axis　are　calculated.

Keyword：

Diodes Beam quality Lasers Gaussian beams Laser theory Semiconductor lasers

Author Community：

[ 1 ] [Lang, Chao]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
[ 2 ] [Yao, Shun]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
[ 3 ] [Chen, Bingzhen]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
[ 4 ] [Jia, Guannan]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
[ 5 ] [Wang, Zhiyong]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China