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Author:

Chen, Ji-Min (Chen, Ji-Min.) (Scholars:陈继民) | He, Chao (He, Chao.) | Zhou, Wei-Ping (Zhou, Wei-Ping.) | Shen, Xue-Fei (Shen, Xue-Fei.)

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Abstract:

With the aim to lower the surface roughnesses of etched samples and the etching threshold fluence of a direct laser irradiation source and to raise the yield of micro-optical elements, a laser induced backside dry etching technique with the assistance of a solid medium as the absorbed layer was proposed to fabricate transparent dielectric materials by direct laser irradiation. By using an alumina ceramic wafer (Al2O3 in 95%, surface roughness less than 500 nm) as the absorber, a 2D transmittance grating in a micro size binary Diffractive Optical Element (DOE) was fabricated on the fused silica with a thickness of 3.2 mm by the 1064 nm Ytterbium Doped Fiber (YDF) laser. And then, the etching parameter curves were fitted and the effect of laser energy density on the parameters was discussed. Finally, the diffraction patterns of micro structure were observed to examine the features of binary DOE. According to the measured results, the binary transmittance grating shows its grating constant in 25 μm, the depth of trench in 4.2 μm, and the RMS roughness of the trench bottom below 40 nm. Furthermore, the etching threshold influence is estimated below 7.66 J/cm2. These results are much lower than those of the etching without any absorbers.

Keyword:

Diffraction gratings Aluminum oxide Fused silica Dry etching Fiber lasers Surface roughness Alumina Optical fiber fabrication Density (optical) Diffractive optical elements Irradiation Dielectric materials

Author Community:

  • [ 1 ] [Chen, Ji-Min]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [He, Chao]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhou, Wei-Ping]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Shen, Xue-Fei]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Optics and Precision Engineering

ISSN: 1004-924X

Year: 2012

Issue: 1

Volume: 20

Page: 31-37

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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