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Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Liu, Cheng-Yan (Liu, Cheng-Yan.) | Wang, Zhuo-Ru (Wang, Zhuo-Ru.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The Cu/solder interfacial stress singularity in solder joints for different shapes and solder materials are evaluated based on the theory of interfacial mechanics. The interfacial stresses are computed by the finite element method to investigate the influence of solder joint shapes, solder materials and material models on the interfacial stress distribution. Results show that a fatter solder shape increases the interfacial singularity, and the singularity of Sn37Pb/Cu interface is greater than those of Sn3.5Ag/Cu and Sn3.0Ag0.5Cu/Cu interfaces. Elastic-plastic deformation and strain effects of the solder under drop/impact loadings reduce the interfacial stresses.

Keyword:

Microelectronics Elastoplasticity Stresses Finite element method

Author Community:

  • [ 1 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Liu, Cheng-Yan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Zhuo-Ru]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2012

Issue: 5

Volume: 38

Page: 652-657

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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