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Author:

Wang, Xinxin (Wang, Xinxin.) | Liu, Jianping (Liu, Jianping.) | Guo, Fu (Guo, Fu.) (Scholars:郭福) | Liu, Li (Liu, Li.) | Lei, Yuanhong (Lei, Yuanhong.)

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Abstract:

The microstructure of Sn37Pb and Sn3Ag0.5Cu solder joints under as-reflowed and isothermal aged conditions were observed respectively. The shear strength of samples were also measured. The results suggested that despite the IMC layer of the Sn37Pb solder joints was thicker than the Sn3Ag0.5Cu solder joints, both of them were within the acceptable range. The Sn3Ag0.5Cu solder joints shows a bigger shear strength due to its special structure of β-Sn primary crystal coated by reticular eutectic. Besides, the shear strength of the two solder joints decreased after aging. Although lead-free solder is the inevitable trend to the development of electronic packaging industry instead of Sn37Pb solder, precision reflowing process still plays an important role to improve the quality of the solder joints.

Keyword:

Crystal structure Ternary alloys Mechanical properties Soldered joints Binary alloys Tin alloys Eutectics Shear strength Silver alloys Light emitting diodes Microstructure Electronics packaging Lead-free solders Copper alloys

Author Community:

  • [ 1 ] [Wang, Xinxin]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Liu, Jianping]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Guo, Fu]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Liu, Li]R and D Center, Beijing Leyard Electronic Science Technology Co., Ltd, Beijing 100091, China
  • [ 5 ] [Lei, Yuanhong]R and D Center, Beijing Leyard Electronic Science Technology Co., Ltd, Beijing 100091, China

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Source :

Transactions of the China Welding Institution

ISSN: 0253-360X

Year: 2012

Issue: 12

Volume: 33

Page: 69-72

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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