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Author:

Pan, Ri (Pan, Ri.) | Zhao, Wanying (Zhao, Wanying.) | Zhong, Bo (Zhong, Bo.) | Chen, Dongju (Chen, Dongju.) (Scholars:陈东菊) | Wang, Zhenzhong (Wang, Zhenzhong.) | Zha, Chunqing (Zha, Chunqing.) | Fan, Jinwei (Fan, Jinwei.) (Scholars:范晋伟)

Indexed by:

EI Scopus SCIE

Abstract:

The polishing efficiency and accuracy for optical elements are strongly affected by the removal characteristics of the polishing tool and are commonly evaluated using a tool influencing function(TIF). During most polishing processes, the TIF is obtained through offline measurements, which are time-consuming. Consequently, the use of polishing forces collected online to evaluate TIF, including its spot shape and efficiency, was investigated as a means of reducing measurement times. Based on the elastic theory, the formation mechanism for an elliptical TIF spot during a bonnet polishing process is thought to have a long axis length that is close to a predefined value and a short axis length that is proportional to the third root of the normal force. Based on the above finding, a polishing force-based prediction model for TIF spot shape was derived and validated. The predicted results agreed well with experimental results. Afterwards, a polishing force-based, semi-quantitative prediction model for TIF efficiency was developed by combining Preston's law and Hertz contact theory. The model was validated experimentally and successfully predicted changing trends in TIF efficiency. Based on this study, the spot shape and efficiency of the TIF can be predicted using polishing forces collected online. This approach provides a potential method that could be used in engineering applications to optimize bonnet polishing processes through a reduction in the time needed for offline measurements.

Keyword:

Bonnet polishing Tool removal characteristics Polishing force

Author Community:

  • [ 1 ] [Pan, Ri]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Wanying]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Chen, Dongju]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Zha, Chunqing]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Fan, Jinwei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Zhong, Bo]China Acad Engn Phys, Res Ctr Laser Fus, Mianyang 621900, Sichuan, Peoples R China
  • [ 7 ] [Wang, Zhenzhong]Xiamen Univ, Dept Mech & Elect Engn, Xiamen 361005, Fujian, Peoples R China

Reprint Author's Address:

  • [Zhong, Bo]China Acad Engn Phys, Res Ctr Laser Fus, Mianyang 621900, Sichuan, Peoples R China

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Source :

JOURNAL OF MANUFACTURING PROCESSES

ISSN: 1526-6125

Year: 2019

Volume: 47

Page: 393-401

6 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:136

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 25

SCOPUS Cited Count: 22

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

Online/Total:667/10645049
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