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Author:

Chen, Y. (Chen, Y..) | He, M.Y. (He, M.Y..)

Indexed by:

EI Scopus

Abstract:

Edge is the region in an image across which the change of brightness intensity is rapid. The main and common approach of edge extraction is to compute image brightness differential, which is one of the most fundamental operations in digital image processing and analysis. In order to provide the interpretation and understanding of differential edge extraction method from geometrical optics perspective as well as the theoretical basis for improving edge extraction method based on image brightness differential in the future, we analyze the brightness differential in edge extraction based on image brightness model in this paper. Firstly, we introduce the digital imaging process and the components of the daylight. Secondly, we discuss the solar illumination and the skylight illumination on the surface of objects and give the image pixel brightness model from geometrical optics perspective. Then, based on the image brightness model, we analyze the differential edge extraction method and discuss the image brightness differential respectively for different colored object surfaces under different illumination conditions. The analysis indicates that the object edge intensities will be very different when by using the differential edge detection operator for different color objects under different lighting conditions and the relationship between daylight illumination, object surface color, and image brightness differential is given.

Keyword:

Image enhancement Optical data processing Image analysis Edge detection Geometrical optics Luminance Extraction

Author Community:

  • [ 1 ] [Chen, Y.]School of Software and Microelectronics, Northwestern Polytechnical University, Xi'an, 710072, China
  • [ 2 ] [He, M.Y.]School of Electronics and Information, Northwestern Polytechnical University, Xi'an, 710072, China
  • [ 3 ] [Chen, Y.]College of Computer Science, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

  • [chen, y.]college of computer science, beijing university of technology, beijing, 100124, china;;[chen, y.]school of software and microelectronics, northwestern polytechnical university, xi'an, 710072, china

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Source :

International Journal of Advancements in Computing Technology

ISSN: 2005-8039

Year: 2012

Issue: 23

Volume: 4

Page: 34-42

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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