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Author:

Liu, Ying (Liu, Ying.) | Jiang, Yijian (Jiang, Yijian.) (Scholars:蒋毅坚)

Indexed by:

EI Scopus PKU CSCD

Abstract:

A rapid fabrication method for conducting poly(vinylidene fluoride) by creating active centre using KrF excimer laser direct etching technique is demonstrated. Study shows that the etching point-defects and line-defects perform active centre function for facilely controlling conducting layer when laser irradiation decreases the laser threshold. The results of laser scanning confocal microscope(LSCM) and scanning electron microscope(SEM), indicate that the 2D net-like microstructures surround the defects are the precursor of conducting layer, which significantly affect the velocity of preparation. The effect of laser thermal cross-linking reaction and laser irradiation cross-linking reaction together contributes to the rapid formation of great conducting layer.

Keyword:

Excimer lasers Etching Laser beam effects Fabrication Point defects Scanning electron microscopy Fluorine compounds Irradiation Crosslinking

Author Community:

  • [ 1 ] [Liu, Ying]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Jiang, Yijian]Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Chinese Journal of Lasers

ISSN: 0258-7025

Year: 2011

Issue: 4

Volume: 38

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 21

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