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Author:

Xie, Hong-Yun (Xie, Hong-Yun.) | Lu, Zhi-Yi (Lu, Zhi-Yi.) | Huo, Wen-Juan (Huo, Wen-Juan.) | Ding, Chun-Bao (Ding, Chun-Bao.) | Liu, Bo-Yu (Liu, Bo-Yu.) | Zhang, Dong-Hui (Zhang, Dong-Hui.) | Zhang, Wan-Rong (Zhang, Wan-Rong.)

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Abstract:

The dependence of amplifier gain flatness on feedback technology is discussed in this paper. Based on small signal models of hetero-junction bipolar transistors (HBTs) with different feedback circuits, the expressions of their S parameter are derived to analyze the influence of different feedback technologies on amplifier performance, especially the amplitude of transmission gain S21. A conclusion has been got that pure resistive feedback improves the reflection in the whole band and makes better input matching and output matching. When a serial inductor or a parallel conductor is added into the feedback circuits to induce reactive feedback, the amplitude of S21 can increase as the frequency increases. As a result, the HBT's intrinsical gain reduction in high frequency is compensated, and the gain reduction induced by resistive feedback is also counteracted. Optimize the resistive feedback and the reactive feedback together, the gain flatness is realized in the whole frequency band of 3.1 GHz to 10.6 GHz.

Keyword:

Feedback amplifiers Ultra-wideband (UWB) Low noise amplifiers Broadband amplifiers Scattering parameters

Author Community:

  • [ 1 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Lu, Zhi-Yi]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Huo, Wen-Juan]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Ding, Chun-Bao]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Liu, Bo-Yu]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Zhang, Dong-Hui]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2011

Issue: 11

Volume: 37

Page: 1638-1643

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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