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Author:

Wang, Wei (Wang, Wei.) (Scholars:王伟) | Tian, Jie (Tian, Jie.) | Ma, Dong-Hui (Ma, Dong-Hui.) (Scholars:马东辉) | Su, Jing-Yu (Su, Jing-Yu.) (Scholars:苏经宇) | Han, Yang (Han, Yang.)

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EI Scopus PKU CSCD

Abstract:

In order to solve the problem of lacking of accurate foundaion data which results in fuzziness and randomness in evaluating cities' ability of reducing earthquake disasters, a comprehensive evaluation method based on cloud models is expatiated in this paper. A new mathematical representation of qualitative concepts is represented by cloud models. With the new models, mapping between qualities and quantities becomes much easier and interchangeable. Fuzziness and randomness are integrated using digital characteristics, such as expected value Ex, entropy En and hyper entropy He. The fuzziness and randomness are not only complementary, but also inseparable. It starts with the uncertainty of the system, then the theory of Analytic Hierarchy Process for reference is used. And it makes the result of evaluation more accurate when used to analyze cities' ability of reducing earthquake disasters.

Keyword:

Fuzzy systems Earthquakes Fuzzy set theory Entropy Cloud computing Disasters Random processes

Author Community:

  • [ 1 ] [Wang, Wei]Institute of Earthquake Resistance and Disaster Reduction, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wang, Wei]College of Architecture and Civil Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Tian, Jie]College of Architecture and Civil Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Ma, Dong-Hui]Institute of Earthquake Resistance and Disaster Reduction, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Su, Jing-Yu]Institute of Earthquake Resistance and Disaster Reduction, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Han, Yang]College of Civil Engineering, Henan University of Technology, Zhengzhou 450052, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2010

Issue: 6

Volume: 36

Page: 764-770

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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