• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Li, Jian-Gang (Li, Jian-Gang.) | An, Tong (An, Tong.) | Liu, Ya-Nan (Liu, Ya-Nan.) | Wang, Yngve (Wang, Yngve.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The strain rate dependent Johnson-Cook material model and the rate independent elastic-plastic model of lead-free solders are used to investigate the influence of strain rate effect on the mechanical behavior of solder joints under drop impact loadings. Failure of the solder joints is predicted and the results are compared with the experimental observations. The strain rate effect of lead-free solders has no influence on the deflection of the PCB during the drop impact but has significant influence on the stress and strain in solder joints. The rate independent elastic-plastic solder material model always underestimates the stress and overestimates the strain of the solder joints. The material model that takes the strain rate effect into account can predict more realistic behavior of the solder joints.

Keyword:

Electronics packaging Drops Elastoplasticity Lead-free solders Strain rate

Author Community:

  • [ 1 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Li, Jian-Gang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Liu, Ya-Nan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Wang, Yngve]Intel (China) Co. Ltd., Shanghai 200000, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2010

Issue: 8

Volume: 36

Page: 1015-1019

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Online/Total:484/10580611
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.