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Author:

Ji, Yuan (Ji, Yuan.) | Wei, Bin (Wei, Bin.) | Wang, Li (Wang, Li.) | Zhang, Yin-Qi (Zhang, Yin-Qi.) | Xie, Xue-Song (Xie, Xue-Song.) | Lü, Chang-Zhi (Lü, Chang-Zhi.) | Zhang, Yue-Fei (Zhang, Yue-Fei.) (Scholars:张跃飞)

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EI Scopus PKU CSCD

Abstract:

To study the electrical properties of single nanowire and device based on nanowire, a two-probe configuration setup was built for measuring current-voltage (I-V) curves of individual ZnO nanowire with a micromanipulator system in a scanning electron microscope. The I-V curves of ZnO nanowires, i.e., almost linear, typical rectifying, almost symmetric and asymmetric were obtained. I-V characteristics are explained by a metal-semiconductor-metal (M-S-M) model and the thermionic emission theory. The current of ZnO nanowires mainly depends on the degree of coupling between the nanowire and two contact tungsten electrodes. The calculation results of electrical properties for ZnO nanowires shows that the resistance of almost linear curve is 4.2 Ω·cm; the effective Schottky barrier height of rectifying I-V characteristics is 0.47 eV.

Keyword:

Tungsten Thermionic emission Wide band gap semiconductors Schottky barrier diodes Micromanipulators Zinc oxide Electrodes Scanning electron microscopy Ohmic contacts Oxide minerals II-VI semiconductors Nanowires

Author Community:

  • [ 1 ] [Ji, Yuan]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wei, Bin]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Li]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zhang, Yin-Qi]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Xie, Xue-Song]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Lü, Chang-Zhi]Electronics Reliability Lab., Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Zhang, Yue-Fei]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2009

Issue: 9

Volume: 35

Page: 1235-1240

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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