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Author:

Wang, Hailing (Wang, Hailing.) | Guo, Xia (Guo, Xia.) | Zhou, Yueping (Zhou, Yueping.) | Shen, Guangdi (Shen, Guangdi.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Inductively coupled plasma (ICP) etching rate and selectivity for GaP are deeply investigated as a function of chamber pressure, RF power, and ICP source power. Meanwhile, the etched profile and the surface morphology are studied in the process of the current-blocking layer fabrication and surface-roughened fabrication. Finally the optimized processing parameters are obtained, that is, the BCl3 flow rate is 3/1, the ICP power is 600 W, the RF power is 100 W, the chamber pressure is 1.0 × 10-2 Pa. In the process of surface-roughened, only BCl3 gas is used to improve the red LED's light intensity by 30%.

Keyword:

Gallium phosphide Chlorine compounds Fabrication III-V semiconductors Morphology Plasma etching Surface morphology Etching Inductively coupled plasma Light emitting diodes

Author Community:

  • [ 1 ] [Wang, Hailing]Beijing Optoelectronics Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Guo, Xia]Beijing Optoelectronics Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Zhou, Yueping]Beijing Optoelectronics Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Shen, Guangdi]Beijing Optoelectronics Technology Laboratory, Beijing University of Technology, Beijing 100022, China

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Source :

Research and Progress of Solid State Electronics

ISSN: 1000-3819

Year: 2008

Issue: 1

Volume: 28

Page: 154-157

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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