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Author:

Guo, Jing (Guo, Jing.) | Guo, Xia (Guo, Xia.) | Liang, Ting (Liang, Ting.) | Gu, Xiaoling (Gu, Xiaoling.) | Lin, Qiaoming (Lin, Qiaoming.) | Shen, Guangdi (Shen, Guangdi.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Bonding of GaAs/GaN was successfully achieved at 600°C in N2 atmosphere for 1h, with two different chemical pretreatments of hydrophilic and hydrophobic processes. Both methods can achieve high bonding strength and large bonding area. Based on the mechanics of the two different pretreatments, the transmittance of the bonding interface with different pretreatments was studied. Results of the transmission spectrum indicate that the hydrophobic process can yield a higher transmittance of 94.7% at 630 nm. Devices were fabricated to execute the EL spectrum measurement, the results of which are consistent with the transmission spectrum.

Keyword:

Gallium nitride Light transmission Bonding Electroluminescence Semiconducting gallium arsenide

Author Community:

  • [ 1 ] [Guo, Jing]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Guo, Xia]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Liang, Ting]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Gu, Xiaoling]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Lin, Qiaoming]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Shen, Guangdi]Beijing Optoelectronic Technology Laboratory, Institute of Electronic, Information and Engineering, Beijing University of Technology, Beijing 100022, China

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Source :

Chinese Journal of Semiconductors

ISSN: 0253-4177

Year: 2007

Issue: 7

Volume: 28

Page: 1092-1096

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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