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Author:

Deng, Jinxiang (Deng, Jinxiang.) (Scholars:邓金祥) | Chen, Guanghua (Chen, Guanghua.) | Beton, P.H. (Beton, P.H..)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Organic thin film field effect transistor of pentacene is fabricated through evaporating heated pentacene powder in high vacuum. Being a semiconductor layer, pentacene thin film is deposited on p-type silicon (100) that has a silicon dioxide layer. The thickness of pentacene thin film is 70 nm. The thickness of Au electrodes including source, drain and gate is 50 nm. As an insulating layer, the silicon dioxide is 300 nm thick. The channel in the pentacene film field effect transistor is 15 μm long, and 190 μm wide. AFM is used to characterize the surface morphology of the pentacene thin film. The influence of deposition rate of the pentacene film on the electric characteristics of pentacene field effect transistor is studied. At a deposition rate of 0.24 and 1.36 nm/min, the mobility of the field effect transistor is 2.7 × 10-4 and 2.2 × 10-6cm2/(V·s) respectively.

Keyword:

Atomic force microscopy Organic compounds Electric properties Surface morphology Field effect transistors Thin films Semiconductor materials Carrier mobility

Author Community:

  • [ 1 ] [Deng, Jinxiang]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Chen, Guanghua]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Beton, P.H.]School of Physics and Astronomy, Nottingham University, United Kingdom

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Source :

Chinese Journal of Semiconductors

ISSN: 0253-4177

Year: 2006

Issue: SUPPL.

Volume: 27

Page: 214-217

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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