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Author:

Zan, Tao (Zan, Tao.) | Fei, Ren-Yuan (Fei, Ren-Yuan.) | Wang, Min (Wang, Min.) (Scholars:王民)

Indexed by:

EI Scopus PKU CSCD

Abstract:

In order to recognize the abnormal pattern of control chart to enhance the automation level of quality management and promote E-management of manufacturing enterprise, in this paper the quality data generated by Monte Carlo simulation is coded through linear transformation to improve the character of the patterns, and then the two kinds of neural networks are applied to recognize the control chart patterns. Through analyzing the test result, the application strategy of control chart recognition is proposed.

Keyword:

Backpropagation Data processing Statistical methods Monte Carlo methods Probability Automation Neural networks Pattern recognition Mathematical transformations Total quality management Computer simulation Manufacture

Author Community:

  • [ 1 ] [Zan, Tao]Beijing Key Lab for Advanced Manufacturing Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Fei, Ren-Yuan]Beijing Key Lab for Advanced Manufacturing Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Wang, Min]Beijing Key Lab for Advanced Manufacturing Technology, Beijing University of Technology, Beijing 100022, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2006

Issue: 8

Volume: 32

Page: 673-676

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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