Through　the　study　of　a　failure　mechanism　model-the　Arrhenius　model-of　electronic　devices　in　accelerated　testing,　it　is　found　that　the　relation　between　the　rate　of　degradation　of　failure　sensitive　parameters　and　the　negative　reciprocal　of　operating　stress　follows　an　exponential　rule　in　accelerated　testing.　Based　on　the　relationships　failure-mechanism　identification　method　in　accelerated　testing　is　presented.　Then　a　progress-stress　accelerated　test　is　constructed　in　the　temperature　range　of　150-310°C,　and　the　consistent　failure-mechanism　range　proves　that　the　method　is　feasible.