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Author:

Zhang, Ze (Zhang, Ze.) | Tian, He (Tian, He.) | Chen, Yan-Hui (Chen, Yan-Hui.) | Sun, Wei (Sun, Wei.) (Scholars:孙威)

Indexed by:

EI Scopus

Abstract:

A systematic high-resolution electron microscopy study of a special type of two-dimensional defects, phason planes, has been carried out in the structurally complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh. The structural characteristics of the phason planes in these two alloys consist of pentagon-banana pairs of polygons but with a different arrangement. Located on the vertex of the polygons are pseudo-Mackay atomic clusters. The detailed atomic structures of the phason planes in both n0- and n-phases of the two alloys have been determined by means of high-resolution electron microscopy and theoretical simulations. The possible ways of displacement of the phason planes in the complex alloys are discussed.

Keyword:

Crystal atomic structure Rhodium metallography Aluminum metallography Atoms Manganese metallography Nickel metallography Electron microscopes Defects High resolution electron microscopy

Author Community:

  • [ 1 ] [Zhang, Ze]Institute of Microstructure and Physical Property of Advanced Materials, Beijing University of Technology, Beijing, China
  • [ 2 ] [Tian, He]Institute of Physics, Chinese Academy of Sciences, Beijing, China
  • [ 3 ] [Chen, Yan-Hui]Institute of Microstructure and Physical Property of Advanced Materials, Beijing University of Technology, Beijing, China
  • [ 4 ] [Sun, Wei]Institute of Microstructure and Physical Property of Advanced Materials, Beijing University of Technology, Beijing, China

Reprint Author's Address:

  • [zhang, ze]institute of microstructure and physical property of advanced materials, beijing university of technology, beijing, china

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Source :

Materials Research and Advanced Techniques

ISSN: 0044-3093

Year: 2006

Issue: 7

Volume: 97

Page: 1001-1007

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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