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Author:

Wang, Ting (Wang, Ting.) | Guo, Xia (Guo, Xia.) | Liu, Bin (Liu, Bin.) | Niu, Nan-Hui (Niu, Nan-Hui.) | Guo, Wei-Ling (Guo, Wei-Ling.) | Shen, Guang-Di (Shen, Guang-Di.)

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Abstract:

Transient temperature field of GaN material irradiated by pulse laser with different energy density was simulated and analyzed for Al2O3/GaN laser lift-off technique using the finite element method (FEM). Al2O3/GaN lift-off experiment has also been carried out using 248-nm KrF excimer laser. The simulated results using FEM were consistent well with experiment results. It was found that for the certain laser source, the temperature varied quickly with time and depth in GaN material, and the energy density of pulse laser should be no less than the threshold energy density in order to realize lift-off successfully and no more than the maximum value for avoiding damage caused by too high temperature. During multi-pulse laser processing, another key parameter was pulse frequency, whose variation range was calculated as the function of the energy density of laser.

Keyword:

Laser beam effects Heat transfer Semiconducting gallium compounds Finite element method Mathematical models Temperature distribution Two dimensional

Author Community:

  • [ 1 ] [Wang, Ting]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Guo, Xia]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Liu, Bin]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Niu, Nan-Hui]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Guo, Wei-Ling]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Shen, Guang-Di]Beijing Optoelectronic Technology Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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Source :

Chinese Journal of Lasers

ISSN: 0258-7025

Year: 2005

Issue: 9

Volume: 32

Page: 1295-1299

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 13

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