Polarization and sectioning characteristic of THz confocal microscopy - Details

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Terahertz　(THz)　confocal　scanning　microscopy　is　the　combination　of　THz　technology　and　confocal　scanning　microscopy.　Here,　we　present　a　conventional　confocal　THz　imaging　system　with　transmission　configuration,　which　is　implemented　using　an　300　GHz　electronic　terahertz　source　and　a　GaAs　terahertz　camera.　The　polarization　and　sectioning　characterization　are　demonstrated　by　utilizing　a　2　mm　resolution　test　stipes.　The　resulting　images　show　consistently　good　resolution.　©　2019　IEEE.

Keyword：

Gallium arsenide III-V semiconductors Terahertz waves Polarization

Author Community：

[ 1 ] [Wan, M.]School of Electrical Electronic Engineering, University College Dublin, Belfield, Dublin 4, Ireland
[ 2 ] [Cibiraite, D.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
[ 3 ] [Li, B.]College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
[ 4 ] [Yuan, H.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
[ 5 ] [Krozer, V.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
[ 6 ] [Krozer, V.]Department of Excellence, University Carlos III Madrid, Madrid, Spain
[ 7 ] [Roskos, H.]Physikalisches Institut, Goethe University Frankfurt, Frankfurt; 60438, Germany
[ 8 ] [Wang, D.]College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
[ 9 ] [Sheridan, J.T.]School of Electrical Electronic Engineering, University College Dublin, Belfield, Dublin 4, Ireland

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ISSN： 2162-2027

Year： 2019

Volume： 2019-September

Language： English

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ESI Highly Cited Papers on the List： 0 Unfold All

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Chinese Cited Count：

30 Days PV： 6

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