For　cement-matrix　materials,　the　microstructure　plays　a　vital　important　role　in　the　research.　Recently,　quantitative　phase　analysis　of　cementitious　materials　can　be　performed　using　the　Rietveld　method　by　fitting　the　calculated　X-ray　diffraction　(XRD)　profile　with　the　observed　one.　The　aim　of　this　paper　is　to　further　perform　the　quantitative　analysis　by　the　Rietveld　method　and　discuss　the　influence　of　testing　factors　on　the　Rietveld　quantitative　phase　analysis.　The　factors　included　the　collection　range　of　pattern,　step　size　and　the　scan　time　of　per　step.　In　this　study,　the　chemical　composition　of　the　samples　was　determined　by　X-ray　fluorescence　(XRF)　spectrometry.　And　their　phase　composition　was　calculated　by　X-ray　powder　diffraction　and　Rietveld　analysis.　The　results　showed　that　the　collection　range　of　pattern　depended　on　the　tested　materials,　and　the　scanning　range　should　include　the　main　diffraction　peak　of　the　sample.　Smaller　step　size　and　longer　scan　time　of　each　step　made　the　fitting　factor　smaller,　also　the　calculated　pattern　coincided　with　the　measured　pattern,　better　enhance　the　precision　of　the　analyses.　©　2017　Trans　Tech　Publications,　Switzerland.