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Author:

Wu, Bin (Wu, Bin.) | Zhang, Ye Chi (Zhang, Ye Chi.) | Zheng, Yang (Zheng, Yang.) | He, Cun Fu (He, Cun Fu.) (Scholars:何存富)

Indexed by:

EI Scopus

Abstract:

Most of imaging algorithms used in guided wave arrays share the same assumption that the signal scattered from defects will propagate uniformly in all directions. However, some recent researches on scattering properties of guided wave in defects demonstrate that the scattered signal is un-uniform even for a circular hole. Scattering properties of defects were studied and effects of sensors distribution strategies were presented in this paper. A 3D FE model was employed to study the sensor arrangement method and two basic imaging methods ellipse and hyperbola algorithm was used. Experiment was implemented in a 3mm aluminum plate with piezoelectric elements. Results show that for crack-like defects and through-hole, both ellipse and hyperbola imaging algorithms were valid. The number and position of transducers affect the accuracy of crack imaging. To detecting different kinds of defect the preferable array arrangement should be set according to the scattering characterization of defect. © (2013) Trans Tech Publications, Switzerland.

Keyword:

Imaging techniques Process control Guided electromagnetic wave propagation Cracks Sensors Control Scattering Geometry Three dimensional computer graphics Automation Algorithms

Author Community:

  • [ 1 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhang, Ye Chi]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Zheng, Yang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [He, Cun Fu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

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ISSN: 1660-9336

Year: 2013

Volume: 330

Page: 510-516

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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