• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Zhong, Weixu (Zhong, Weixu.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞) | An, Tong (An, Tong.) | Liu, Chengyan (Liu, Chengyan.)

Indexed by:

EI Scopus

Abstract:

The growth of intermetallic compounds (IMC) at the Sn3.0Ag0.5Cu/Cu interface is investigated under aging temperature of 150 °C and aging time of 100, 300 and 500 hours. The relationship between the thickness of the IMC and aging time is fitted out, and the growth law of the IMC at Sn3.0Ag0.5Cu/Cu interface under isothermal aging condition is obtained. Mechanical properties of the Cu6Sn5 and Cu3Sn are obtained by a G200 nanoindentation tester. It indicates that with the Cu6Sn5 thickness increases, its Young's modulus and hardness have no change. The Young's modulus of Cu3Sn is greater than that of Cu 6Sn5, but the hardness of Cu3Sn is lower than that of Cu6Sn5. The nanoindentation experiments of the Sn3.0Ag0.5Cu/Cu interfacial zone show that the hardness of Cu, Cu3Sn, Cu6Sn5 and Sn3.0Ag0.5Cu has an order in magnitude of Cu6Sn5 > Cu3Sn > Cu Sn3.0Ag0.5Cu. © 2011 IEEE.

Keyword:

Tin alloys Intermetallics Morphology Packaging Nanoindentation Elastic moduli Silver alloys Ternary alloys Binary alloys Hardness Electronics packaging

Author Community:

  • [ 1 ] [Zhong, Weixu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Liu, Chengyan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Year: 2011

Page: 523-528

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

Online/Total:468/10598979
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.