• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Ma Yu-Tian (Ma Yu-Tian.) | Liu Jun-Biao (Liu Jun-Biao.) | Han Li (Han Li.) | Tian Li-Feng (Tian Li-Feng.) | Wang Xue-Cong (Wang Xue-Cong.) | Meng Xiang-Min (Meng Xiang-Min.) | Xiao Shan-Qu (Xiao Shan-Qu.) | Wang Bo (Wang Bo.) (Scholars:王波)

Indexed by:

EI Scopus SCIE PKU CSCD

Abstract:

Nuclear fusion energy is a clean and safe energy resource with huge potential. Tungsten is the primary candidate for plasma facing materials (PFMs) in future nuclear reactors because of its high melting point, high thermal conductivity and high resistance to sputtering and erosion. However, the interaction between tungsten and helium plasma generated by deuterium-tritium nuclear reactions will result in the degeneration of tungsten through helium blistering in tungsten. The solubility of helium in tungsten is low, and it tends to aggregate at grain boundary, phase boundary, vacancies and dislocations, thus forming helium bubbles. These bubbles will lead to microstructure changes of surface and bulk phases, as well as a decrease in mechanical properties, which seriously affects the service life of material. Limited by experimental techniques, some basic problems for the growth of helium bubbles in tungsten are not clear, for instance, how the helium clusters migrate, and nucleation mechanisms. The study of complex helium bubble formation, evolution and its underlying mechanism in tungsten PFM necessitates advanced experimental techniques. Traditional methods such as ion implantation, scanning electron microscope and transmission electron microscope are inadequate for this task. Therefore, we propose the helium ion microscope method to investigate the aforementioned several aspects of helium in tungsten in situ and real-time. Here, a helium irradiation experiment is performed by helium ion microscope (HIM), featuring nanostructure fabrication, ion implantation and microscopic imaging. The HIM can generate an ion beam with energy in a range of 0.5-35 keV and an flux upto 10(25) ions/m(2)/s. In the process of helium ion implantation, we observe in situ and real time the helium blistering and the morphological evolution on tungsten surface, in order to capture the helium implantation-induced microscopic damage evolution on tungsten surface and subsurface. From the results of in situ HIM experiments, it is believed that a strong orientation dependence of blistering is observed with the blister occurring preferentially on the surface of grains with normal direction close to (111), and surface blistering of tungsten is directly related to cracks immediately below the surface. The present study demonstrates that the HIM is a powerful tool for investigating the helium blistering behavior in tungsten and provides valuable experimental data and reference for designing PFMs.

Keyword:

helium ion microscope real-time analysis of in situ tungsten helium behavior

Author Community:

  • [ 1 ] [Ma Yu-Tian]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 2 ] [Liu Jun-Biao]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 3 ] [Han Li]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 4 ] [Tian Li-Feng]Chinese Acad Sci, Tech Inst Phys & Chem, Beijing 100190, Peoples R China
  • [ 5 ] [Wang Xue-Cong]Chinese Acad Sci, Tech Inst Phys & Chem, Beijing 100190, Peoples R China
  • [ 6 ] [Meng Xiang-Min]Chinese Acad Sci, Tech Inst Phys & Chem, Beijing 100190, Peoples R China
  • [ 7 ] [Xiao Shan-Qu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 8 ] [Wang Bo]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 9 ] [Liu Jun-Biao]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 10 ] [Han Li]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 11 ] [Meng Xiang-Min]Univ Chinese Acad Sci, Beijing 100049, Peoples R China

Reprint Author's Address:

  • [Ma Yu-Tian]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

ACTA PHYSICA SINICA

ISSN: 1000-3290

Year: 2019

Issue: 4

Volume: 68

1 . 0 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:123

JCR Journal Grade:4

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:639/10636951
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.