• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Li, Z. (Li, Z..) | He, C. (He, C..) | Liu, Z. (Liu, Z..) | Wu, B. (Wu, B..) | Chen, H. (Chen, H..)

Indexed by:

Scopus PKU CSCD

Abstract:

Circumferential guided waves inspection technique is one of important research areas in ultrasonic nondestructive testing and elastodynamics. This paper fully reviewed circumferential guided waves inspection technique and its research progress. First, the classification, dispersion characteristic, excitation method of circumferential guided waves, the relationship between circumferential guided waves in pipe and guided waves in plate were introduced. Circumferential guided waves in multi-layered pipes were briefly reviewed. Based on these, the progress of transducer technology, signal processing and engineering application of circumferential guided waves were focused. Finally, conclusions and outlook on future development of circumferential guided waves inspection technique were prospected. © 2018, Editorial Department of Journal of Beijing University of Technology. All right reserved.

Keyword:

Circumferential guided waves; Defect; Dispersion; Mode; Pipe

Author Community:

  • [ 1 ] [Li, Z.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [He, C.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Liu, Z.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Wu, B.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Chen, H.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

  • [He, C.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of TechnologyChina

Show more details

Related Keywords:

Related Article:

Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2018

Issue: 5

Volume: 44

Page: 641-657

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

Online/Total:449/10596144
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.