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Author:

Chen, J. (Chen, J..) | Shi, Y. (Shi, Y..)

Indexed by:

Scopus

Abstract:

The successful detection of defects in a structure using non-destructive testing (NDT) is very significant to maintain a reliable operation of the structure. Thus the reliability of the NDT method becomes a critical factor that influences the reliability evaluation of the structure. A brief review on the NDT reliability literature is presented in the first section of the paper. The reliability operating characteristic curve of ultrasonic contact testing and immersion testing of frictional bonded piping joints is plotted using the signal-to-noise ratio (SNR) as a criterion. It shows that ultrasonic testing of these specimens has a higher reliability in the detection of macro-defects than micro-defects. Immersion testing has a higher reliability than contact testing. Digital signal processing (DSP) technology has the potential to increase the SNR of the ultrasonic signal. A traditional DSP routine, band-pass filtering, and the most recent DSP method, wavelet transform, are utilised to enhance the SNR of signals, to increase the reliability of the ultrasonic testing. The results indicate that after the SNR of signals is enhanced by a suitable digital signal processing technique, the reliability of the ultrasonic testing increases.

Keyword:

Digital signal processing; Nondestructive testing; Reliability; Reliability operating characteristic; Signal-to-noise ratio; Ultrasonic testing

Author Community:

  • [ 1 ] [Chen, J.]Sch. of Materials Sci. and Eng., Beijing Polytechnic University, Beijing 100022, China
  • [ 2 ] [Shi, Y.]Sch. of Materials Sci. and Eng., Beijing Polytechnic University, Beijing 100022, China

Reprint Author's Address:

  • [Shi, Y.]Sch. of Materials Sci. and Eng., Beijing Polytechnic University, Beijing 100022, China

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Source :

Insight: Non-Destructive Testing and Condition Monitoring

ISSN: 1354-2575

Year: 2002

Issue: 4

Volume: 44

Page: 237-245

1 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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