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Author:

Li, G.H. (Li, G.H..) | Yan, F.Z. (Yan, F.Z..) | Han, D.J. (Han, D.J..) | Ji, C.Z. (Ji, C.Z..) | Zou, D.S. (Zou, D.S..) | Xu, P. (Xu, P..) | Yang, Y.H. (Yang, Y.H..) | Huang, C. (Huang, C..) | Huang, D.H. (Huang, D.H..)

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Scopus

Abstract:

The principle of operation of Si and SiGe resistor load flip flops and Si resistor load ring oscillators of n channel vertical dual carrier field effect transistors are reviewed. Measured data from experimental verification of the principle of operation is presented. © 2001 IEEE.

Keyword:

Author Community:

  • [ 1 ] [Li, G.H.]Beijing Normal University, Beijing, China
  • [ 2 ] [Yan, F.Z.]Beijing Normal University, Beijing, China
  • [ 3 ] [Han, D.J.]Beijing Normal University, Beijing, China
  • [ 4 ] [Ji, C.Z.]Beijing Normal University, Beijing, China
  • [ 5 ] [Zou, D.S.]Beijing Polytechnic University, Beijing, China
  • [ 6 ] [Xu, P.]Hua Ko Electronics Co. Ltd., Hong Kong, Hong Kong
  • [ 7 ] [Yang, Y.H.]China Aerospace Corporation, Beijing, China
  • [ 8 ] [Huang, C.]China Aerospace Corporation, Beijing, China
  • [ 9 ] [Huang, D.H.]Florence Science and Technology, San Jose, CA, United States

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Source :

2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings

Year: 2001

Volume: 1

Page: 551-554

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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