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Author:

Han, Jing (Han, Jing.) | Sun, Jian (Sun, Jian.) | Wen, Tingyu (Wen, Tingyu.) | Guo, Fu (Guo, Fu.) (Scholars:郭福)

Indexed by:

EI Scopus SCIE

Abstract:

Electron backscattered diffraction was employed to observe the orientations of as-solidified Sn3.0Ag3.0Bi3.0In (SABI333) joints. Unlike other Sn-based solder joints consisting of only one grain or of tricrystals, the SABI333 joints typically consisted of polycrystals. The polycrystals were found to originate from Sn grains with deflections (> 15A degrees) from the [110] and [] directions, i.e., the directions in which nucleation tends to occur, and the Bi and In atoms dissolved in the SnAg melt significantly enhanced the deflection. In addition, the orientations of the SABI333 solder joints were highly related to the solidification temperature. Higher solidification temperatures were associated with higher degrees of deviation. Additionally, two types of double tricrystals of Sn formed during solder joint solidification in the SABI333 joints. Although the characteristics of the twinning differed, both types had 80A degrees-90A degrees misorientations. One system featured four orientations of Sn grain twinning with a [100] or [010] axis, while the other one featured perpendicular tricrystals.

Keyword:

Author Community:

  • [ 1 ] [Han, Jing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Sun, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Wen, Tingyu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Han, Jing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

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Source :

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN: 0957-4522

Year: 2018

Issue: 14

Volume: 29

Page: 12221-12230

2 . 8 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:260

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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