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Author:

Mi, Y.-L. (Mi, Y.-L..) | Zhang, M. (Zhang, M..) | Yan, H. (Yan, H..)

Indexed by:

Scopus PKU CSCD

Abstract:

Considering the effect of the interface spin-flip scattering, the spin-injection across ferro-magnet/nonmagnetic-semiconductor/ferro magnet heterostuctures with finite size was explored theoretically. Due to the fact that interfacial spin-flip scattering leads to spin-memory losses at the interfaces, the spin-up component of spin-polarized current could not be continuous across the interface. It is found that when the spin injection efficiency varies from zero to unity, the tunneling magnetoresistance of the ferromagnet/nonmagnetic-semiconductor/ferromagnet junction presents two orders of changes in magnitude, which reflects the fact that the spin-flip scattering at the interface directly affects the tunneling magnetoresistance of ferrom agnet/nonmagnetic-semiconductor/ferromagnet.

Keyword:

Finite width; Spin injection efficiency; Spin-flip scattering

Author Community:

  • [ 1 ] [Mi, Y.-L.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Mi, Y.-L.]College of Science, North China University of Technology, Beijing 100041, China
  • [ 3 ] [Zhang, M.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Yan, H.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address:

  • [Mi, Y.-L.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China

Email:

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Source :

Journal of Functional Materials and Devices

ISSN: 1007-4252

Year: 2009

Issue: 4

Volume: 15

Page: 327-331

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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