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Author:

Wang, P. (Wang, P..) | Zhang, Y.-C. (Zhang, Y.-C..) | Gao, X.-J. (Gao, X.-J..) (Scholars:高学金) | Qi, Y.-S. (Qi, Y.-S..)

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Scopus PKU CSCD

Abstract:

To solve the problems that multi-way independent component analysis (MICA) need to assume process variables conforming non-Gaussian distribution and the monitoring statistics based on the Mahalanobis distance of MICA will cause reduction in fault detection rate, a new monitoring method based on Multi-way Independent Component Analysis and One-Class Support Vector Machines (MICA-OCSVM) was researched. Firstly, the independent components (ICs) from all batches of batch process were extracted by MICA. Secondly, OCSVM was used to model for all batches' ICs at each time, separately. Meanwhile, decision hyper-plane of the OCSVM model was chosen to construct monitoring statistics. Finally, the confidence limits were determined using kernel density estimation by the monitoring statistics calculated from all modeling data. The method was applied to fed-batch penicillin fermentation process. The experiment results show that in contrast to the fault detection methods based on traditional MICA, the proposed method can make full use of ICs' structure information regardless of the distribution of process variables and can reduce the rate of misinformation and omission effectively.

Keyword:

Batch process; Fault detection; Multi-way independent component analysis (MICA); One-class support vector machines (OCSVM)

Author Community:

  • [ 1 ] [Wang, P.]College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhang, Y.-C.]College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Gao, X.-J.]College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Qi, Y.-S.]College of Electric Power, Inner Mongolia University of Technology, Huhhot, 010051, China

Reprint Author's Address:

  • 高学金

    [Gao, X.-J.]College of Electronic Information & Control Engineering, Beijing University of TechnologyChina

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2014

Issue: 10

Volume: 40

Page: 1472-1477

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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