Alternative Techniques to Reduce Interface Traps in n-Type 4H-SiC MOS Capacitors - Details

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[ 1 ] [Pensl, G.]Universität Erlangen-Nürnberg, Staudtstraße 7/A3, 91058 Erlangen, Germany
[ 2 ] [Beljakowa, S.]Universität Erlangen-Nürnberg, Staudtstraße 7/A3, 91058 Erlangen, Germany
[ 3 ] [Frank, T.]Bunsenstraße 56, 91058 Erlangen, Germany
[ 4 ] [Gao, K.]College of Materials Science and Engineering, Beijing University of Technology, Pingleyuan 100, Chaoyang District, 100124 Beijing, China
[ 5 ] [Speck, F.]Universität Erlangen-Nürnberg, Institut für Physik der, Kondensierten Materie, Erwin-Rommel-Straße 1, 91058 Erlangen, Germany
[ 6 ] [Seyller, T.]Universität Erlangen-Nürnberg, Institut für Physik der, Kondensierten Materie, Erwin-Rommel-Straße 1, 91058 Erlangen, Germany
[ 7 ] [Ley, L.]Universität Erlangen-Nürnberg, Institut für Physik der, Kondensierten Materie, Erwin-Rommel-Straße 1, 91058 Erlangen, Germany
[ 8 ] [Ciobanu, F.]Universität Erlangen-Nürnberg, Institut für Optik, Information Und Photonik, Bau 24 Günther-Scharowsky-Straße 1, 91058 Erlangen, Germany
[ 9 ] [Afanas'ev, V.]University of Leuven, Department of Physics, Celestijnenlaan 200D, 3001 Leuven, Belgium
[ 10 ] [Stesmans, A.]University of Leuven, Department of Physics, Celestijnenlaan 200D, 3001 Leuven, Belgium
[ 11 ] [Kimoto, T.]Kyoto University, Electronic Science and Engineering, A1-301, Katsura, Nishikyo, Kyoto 615 8501, Japan
[ 12 ] [Kimoto, T.]Kyoto University, Photonics and Electronics Science and Engineering Center, Kyotodaigaku-katsura, Nishikyo, Kyoto 615-8510, Japan
[ 13 ] [Schöner, A.]ACREO AB, Electrum 236, Isafjordsgatan 22, 16440 Kista, Sweden

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[Pensl, G.]Universität Erlangen-Nürnberg, Staudtstraße 7/A3, 91058 Erlangen, Germany

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Silicon Carbide

Monograph name： Silicon Carbide

Volume： 2

Issue： Wiley-VCH

Language： English

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WoS CC Cited Count： 0

SCOPUS Cited Count： 5

ESI Highly Cited Papers on the List： 0 Unfold All

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30 Days PV： 9

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材料科学与工程学院本学院/部未明确归属的数据

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