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Author:

Xue, P. (Xue, P..) (Scholars:薛鹏) | Gao, X. (Gao, X..) | Wang, P. (Wang, P..) | Qi, Y. (Qi, Y..)

Indexed by:

Scopus

Abstract:

When binary tree SVM is used for multi-class fault diagnosis, inner-class distance or between-class distance is always used to decide the classification hierarchy, but these methods cannot take the comprehensive separability information between classes into account, which leads to decrease the accuracy of fault diagnosis easily, so an improved binary tree SVM method is proposed. Combining the separability of inner-class with the separability of between-class, a measurement formula is built, which is based on a principle, that is the same class is relatively clustered and the different classes have a relatively far distance is easier to classify. Then according to it, the classification hierarchy is decided. In the end, the new method is applied to fault diagnosis of Tennessee Eastman (TE) process, the experimental results show it has an excellent integrated performance in comparison to other methods based on SVM. © 2015 IEEE.

Keyword:

Binary Tree; Fault Diagnosis; Support Vector Machine; Tennessee Eastman

Author Community:

  • [ 1 ] [Xue, P.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Gao, X.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Wang, P.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Qi, Y.]School of Electric Power, Inner Mongolia University of Technology, Huhhot, 010051, China

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Source :

2015 IEEE International Conference on Information and Automation, ICIA 2015 - In conjunction with 2015 IEEE International Conference on Automation and Logistics

Year: 2015

Page: 2182-2186

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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