Illuminating quality assessment used by image collection - Details

Author：

Wang, T. (Wang, T..) (Scholars：王腾) | Chen, T. (Chen, T..) | Zhang, L. (Zhang, L..) | Zuo, T.-C. (Zuo, T.-C..) | Liu, S.-B. (Liu, S.-B..) (Scholars：刘世炳)

Indexed by：

Scopus PKU CSCD

Abstract：

In　the　micro-vision　measurement　system,　based　on　the　computer　micro-vision　and　the　micro-optics,　an　illuminating　quality　assessment　system　of　digital　images　for　improving　the　imaging　quality　and　the　precision　of　the　micro-image　measurement　was　built.　In　micro-vision　measurement　system,　applying　the　illuminating　quality　assessment　system,　the　best　illuminating　condition　was　got.

Keyword：

Computer vision; Digital image; Illuminating quality; Measurement of MEMS; MEMS

Author Community：

[ 1 ] [Wang, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 2 ] [Chen, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 3 ] [Zhang, L.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 4 ] [Zuo, T.-C.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 5 ] [Liu, S.-B.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China

Reprint Author's Address：

王腾
[Wang, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China

Email：

wangtong@emails.bjut.edu.cn

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Source ：

Optical Technique

ISSN： 1002-1582

Year： 2005

Issue： SUPPL.

Volume： 31

Page： 12-13

Cited Count：

WoS CC Cited Count： 0

SCOPUS Cited Count：

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 3

Affiliated Colleges：

材料科学与工程学院本学院/部未明确归属的数据

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