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Author:

Chen, D. (Chen, D..) | Lei, Y. (Lei, Y..) | Li, X. (Li, X..) | Shi, Y. (Shi, Y..) | Tian, Z. (Tian, Z..)

Indexed by:

Scopus

Abstract:

In the present research, the Monte Carlo technique was used to simulate the grain in the heat-affected zone (HAZ) of an ultrafine grain steel. An experimental data based (EBD) model proposed by Gao was used to establish the relation between tMCS and real time temperature kinetics in our simulation. The simulations give out the evolution of grain structure and grain size distribution in the HAZ of the ultrafine grain steel. A Microsoft Window based on computer program for the simulation of grain growth in the HAZ of weldment in three dimensions has been developed using the Monte Carlo technique. For the system, inputting the temperature field data and material properties, the evolution of grain structure, both image of simulated grain structure and numerical data reflecting the grain size distribution can be produced by the program. The system was applied to the ultrafine grain steel welding, and the simulated results show that the ultrafine grain steel has a large tendency of grain growth.

Keyword:

HAZ; Monte Carlo simulation; Ultra-fine grain steel

Author Community:

  • [ 1 ] [Chen, D.]Sch. of Mat. Sci. and Eng., Beijing Polytech. Univ., Beijing 100022, China
  • [ 2 ] [Lei, Y.]Sch. of Mat. Sci. and Eng., Beijing Polytech. Univ., Beijing 100022, China
  • [ 3 ] [Li, X.]Sch. of Mat. Sci. and Eng., Beijing Polytech. Univ., Beijing 100022, China
  • [ 4 ] [Shi, Y.]Sch. of Mat. Sci. and Eng., Beijing Polytech. Univ., Beijing 100022, China
  • [ 5 ] [Tian, Z.]Central Iron and Steel Res. Inst., Beijing 100081, China

Reprint Author's Address:

  • [Shi, Y.]Sch. of Mat. Sci. and Eng., Beijing Polytech. Univ., Beijing 100022, China

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Source :

Journal of Materials Science and Technology

ISSN: 1005-0302

Year: 2003

Issue: 4

Volume: 19

Page: 309-312

1 0 . 9 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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