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Author:

Yuan Yue (Yuan Yue.) | Feng Shi-Wei (Feng Shi-Wei.) (Scholars:冯士维) | Guo Chun-Sheng (Guo Chun-Sheng.) | Yan Xin (Yan Xin.) | Feng, Rui-Rui (Feng, Rui-Rui.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, a digital method for transient temperature distribution measurement of field programmable gate array (FPGA)-based systems is proposed. The smart thermal sensors used rely on correspondence between the delay and temperature in a ring oscillator. The tested temperature was converted into a time signal with a thermally-sensitive width. The output frequency is read out by a counter with a scan path, and then, transited to PC by a Universal Serial Bus (USB) interface. We capture the infrared images of the FPGA chip by infrared camera. The images were compared with the thermal map of the die constructed using an array of sensors. The tested temperature error varies by less than 1.6 degrees C in the range from 20 degrees C to 90 degrees C, and the maximum sampling rate is 330 Hz. (C) 2014 Elsevier Ltd. All rights reserved.

Keyword:

Thermal sensor Field programmable gate array (FPGA) Temperature distribution Oscillator Transient

Author Community:

  • [ 1 ] [Yuan Yue]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Feng Shi-Wei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Guo Chun-Sheng]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Yan Xin]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Feng, Rui-Rui]Sichuan Univ, Coll Phys Sci & Technol, Sichuan 610207, Peoples R China

Reprint Author's Address:

  • 冯士维

    [Feng Shi-Wei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

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Source :

MICROELECTRONICS RELIABILITY

ISSN: 0026-2714

Year: 2015

Issue: 2

Volume: 55

Page: 396-401

1 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:174

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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