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Author:

Zeng, Yong (Zeng, Yong.) | Zhao, Yan (Zhao, Yan.) (Scholars:赵艳) | Jiang, Yijian (Jiang, Yijian.) (Scholars:蒋毅坚)

Indexed by:

EI Scopus SCIE

Abstract:

ZnO thin films were grown by pulsed laser deposition on titanium substrates at different substrate temperatures ranging from 300 to 700 degrees C. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), photoluminescence, and Raman spectroscopy are employed to investigate the change of properties. XRD, XPS, and Raman data showed that the films consisted of TiO2 at high substrate temperature, which will deteriorate the crystallization quality of ZnO films. The optimum temperature for the growth of ZnO films on the Ti substrate is about 500 degrees C in this paper. The ZnO films grown on titanium substrate can be used in direct current, microwave, and medical applications. Copyright (C) 2014 John Wiley & Sons, Ltd.

Keyword:

Raman spectroscopy zinc oxide photoluminescence titanium substrate X-ray diffraction pulsed laser deposition

Author Community:

  • [ 1 ] [Zeng, Yong]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Yan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Jiang, Yijian]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 赵艳

    [Zhao, Yan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

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Source :

SURFACE AND INTERFACE ANALYSIS

ISSN: 0142-2421

Year: 2014

Issue: 9

Volume: 46

Page: 602-606

1 . 7 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:202

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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