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Author:

Yuan, Haiying (Yuan, Haiying.) | Mei, Jiaping (Mei, Jiaping.) | Song, Hongying (Song, Hongying.) | Guo, Kun (Guo, Kun.)

Indexed by:

EI Scopus SCIE

Abstract:

The Count Compatible Pattern Run-Length (CCPRL) coding compression method is proposed to further improve the compression ratio. Firstly, a segment of pattern in the test set is retained. Secondly, don't-care bits are filled so as to make subsequent patterns compatible with the retained pattern for as many times as possible until it can no longer be made compatible. Thirdly, the compatible patterns are represented by symbol "0" (equal) and symbol "1" (contrary) in the codeword. In addition, the number of consecutive compatible patterns is counted and expanded into binary which indicates when the codeword ends. At last, the six largest ISCAS'89 benchmark circuits verify the proposed method, the experimental results show that the average compression ratio achieved is up to 71.73 %.

Keyword:

Test data compression Pattern run-length coding System-on-a-chip Compatible pattern

Author Community:

  • [ 1 ] [Yuan, Haiying]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Mei, Jiaping]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Song, Hongying]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Guo, Kun]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Yuan, Haiying]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

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Source :

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

ISSN: 0923-8174

Year: 2014

Issue: 2

Volume: 30

Page: 237-242

0 . 9 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:176

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 13

SCOPUS Cited Count: 19

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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