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Author:

Yang Zhen (Yang Zhen.) (Scholars:杨震) | Wang Laitao (Wang Laitao.) | Fan Kefeng (Fan Kefeng.) | Lai Yingxu (Lai Yingxu.) (Scholars:赖英旭)

Indexed by:

EI Scopus SCIE

Abstract:

Exemplar-based clustering algorithm is very efficient to handle large scale and high dimensional data, while it does not require the user to specify many parameters. For current algorithms, however, are the inabilities to identify the optimal results or specify the number of clusters automatically. To remedy these, in this work, we propose and explore the idea of exemplar-based clustering analysis optimized by genetic algorithms, abbreviated as ECGA framework, which use genetic algorithms for optimizing and combining the results. First, an exemplar-based clustering framework based on canonical genetic algorithm is introduced. Then the framework is optimized with three new genetic operators: (1) Geometry operator which limits the typology distribution of exemplars based on pair-wise distances, (2) EM operator which apply EM (Expectation maximization) algorithm to generate children from previous population and (3) Vertex substitution operator which is initialized with genetic algorithm and select exemplars by using the variable neighborhood search meta-heuristic framework. Theoretical analysis proves the ECGA can achieve better chance to find the optimal clustering results. Experimental results on several synthetic and real data sets show our ECGA provide comparable or better results at the cost of slightly longer CPU time.

Keyword:

Exemplar-based clustering Clustering analysis Genetic algorithms

Author Community:

  • [ 1 ] [Yang Zhen]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Wang Laitao]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Lai Yingxu]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Fan Kefeng]China Elect Standardizat Inst, Beijing 100007, Peoples R China

Reprint Author's Address:

  • 赖英旭

    [Lai Yingxu]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China

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Source :

CHINESE JOURNAL OF ELECTRONICS

ISSN: 1022-4653

Year: 2013

Issue: 4

Volume: 22

Page: 735-740

1 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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