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Abstract:
为了提高980 nm半导体激光器的可靠性,采用氦离子注入形成腔面电流非注入区技术制作了4μm条宽的脊形波导激光器,并利用同一块外延片制作了常规工艺的4 μm脊形波导激光器作为对比.经过长期老化实验得知:常规工艺器件在1500 h前全部失效,而采取新技术的器件寿命超过了3000 h.通过对器件的扫描电镜分析发现,腔面灾变性损伤、铟焊料的质量和腔面污染等因素对器件失效有直接影响.
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激光与光电子学进展
ISSN: 1006-4125
Year: 2012
Issue: 9
Volume: 49
Page: 127-131
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 11
Chinese Cited Count:
30 Days PV: 2
Affiliated Colleges: