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Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | An, Tong (An, Tong.) | Chen, Na (Chen, Na.)

Indexed by:

EI Scopus SCIE

Abstract:

As traditional lead-based solders are banned and replaced by lead-free solders, the drop impact reliability is becoming increasingly crucial because there is little understanding of mechanical behaviors of these lead-free solders at high strain rates. In this paper mechanical properties of one lead-based solder, Sn37Pb, and two lead-free solders, Sn3.5Ag and Sn3.0Ag0.5Cu, were investigated at strain rates that ranged from 600 s(-1) to 2200 s(-1) by the split Hopkinson pressure and tensile bar technique. At high strain rates, tensile strengths of lead-free solders are about 1.5 times greater than that of the Sn37Pb solder, and also their ductility are significantly greater than that of the Sn37Pb. Based on the experimental data, strain rate dependent Johnson-Cook models for the three solders were derived and employed to predict behaviors of solder joints in a board level electronic package subjected to standard drop impact load. Results indicate that for the drop impact analysis of lead-free solder joints, the strain rate effect must be considered and rate-dependent material models (if lead-free solders are indispensable. [DOI: 10.1115/1.3168600]

Keyword:

strain rate effect constitutive model drop impact lead-free solder

Author Community:

  • [ 1 ] [Qin, Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [An, Tong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Chen, Na]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 秦飞

    [Qin, Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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Source :

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME

ISSN: 0021-8936

Year: 2010

Issue: 1

Volume: 77

2 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 35

SCOPUS Cited Count: 41

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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