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Abstract:
为了获得n-GaN的低接触电阻的欧姆接触,采用Cr/Au/Ni/Au金属化系统与n-GaN形成欧姆接触,并对其不同温度下的接触电阻率进行了测试分析. 室温下Cr/Au/Ni/Au的接触电阻率为0.32mΩ·cm2,随着温度的升高,接触电阻率略有增加,在300℃时接触电阻率为0.65mΩ·cm2,因此此欧姆接触适合在高温下使用.
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Source :
北京工业大学学报
ISSN: 0254-0037
Year: 2005
Issue: 5
Volume: 31
Page: 449-451
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 3
Chinese Cited Count:
30 Days PV: 6
Affiliated Colleges: