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Author:

Yan, YF (Yan, YF.) | Liu, JP (Liu, JP.) (Scholars:刘加平) | Shi, YW (Shi, YW.) | Xia, ZD (Xia, ZD.)

Indexed by:

EI Scopus SCIE

Abstract:

The Sn-Pb solder is widely used in the electronics industry. With the development of surface mount technology and miniaturization of elements, mechanical properties of the solder are critical. Creep resistance and size stability of soldered joints are important for optical electronics. In the present work, Cu particles with a size of about 8 mum were added to the eutectic 63Sn-37Pb solder to improve the creep property of the soldering alloy. The contents of the Cu particles are 5 vol.% and 10 vol.% separately. The solder matrix is 63Sn37Pb particles with a normal size of 43 mum. The composite solder pastes are manufactured from a mixture of these particles with no-clean flux. Under reflow soldering, the metal particles were uniformly dispersed in the Sn-Pb alloy, and very thin intermetallic compounds were formed between the particles and matrix. To simulate practical soldering of printed circuit boards, a specially designed mini specimen with lap joint is used for the creep-rupture test. For the condition of ambient temperature, the creep-rupture lifetime of the soldered joint can be increased by one order quantitatively using the composite solder compared to the 63Sn37Pb eutectic solder. Other mechanical properties are measured also. In addition, the wetting property of the enhanced solder is good through the wettability test.

Keyword:

composite solder Sn-Pb alloy creep particles enhanced

Author Community:

  • [ 1 ] Beijing Univ Technol, Sch Mat Sci & Engn, Key Lab Adv Funct Mat, State Educ Minist, Beijing 100022, Chaoyang Dist, Peoples R China

Reprint Author's Address:

  • [Yan, YF]Beijing Univ Technol, Sch Mat Sci & Engn, Key Lab Adv Funct Mat, State Educ Minist, Beijing 100022, Chaoyang Dist, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2004

Issue: 3

Volume: 33

Page: 218-223

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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