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Author:

Shi, Yaowu (Shi, Yaowu.) | Liu, Jianping (Liu, Jianping.) | Yan, Yanfu (Yan, Yanfu.) | Xia, Zhidong (Xia, Zhidong.) | Lei, Yongping (Lei, Yongping.) (Scholars:雷永平) | Guo, Fu (Guo, Fu.) (Scholars:郭福) | Li, Xiaoyan (Li, Xiaoyan.)

Indexed by:

CPCI-S EI Scopus SCIE

Abstract:

In the present work the creep properties of Sn37Pb- and Sn0.7Cu-based composite solders reinforced with metallic nano- and microsized Cu and Ag particles have been studied. First, a series of volume percentages of reinforcements were selected to optimize the content of reinforcing particles. Then, the composite solder with optimum volume fraction of reinforcement particles, corresponding to the maximum creep rupture lifetime, was selected to investigate the effect of applied stress and temperature on the creep rupture lifetime of the composite solder joints. In the creep rupture lifetime test, small single-lap tensile-shear joints were adopted. The results indicate that composite solders reinforced with microsized particles exhibit better creep strengthening than composite solders reinforced with nanosized particles, although the mechanical tensile shear strength of composite solder joints reinforced with nanosized particles may be higher than those reinforced with microsized particles. Moreover, the creep strengthening action of the reinforcement particles is more obvious under conditions of lower applied stress or lower test temperature. Strengthening by metallic Cu or Ag reinforcement particles decreases with increasing temperature or applied stress. The Sn0.7Cu-based composite solder reinforced with microsized Ag particles is a low-cost lead-free solder that is easy to process and may have good market potential.

Keyword:

reinforcements composite solder creep property particle size

Author Community:

  • [ 1 ] [Shi, Yaowu]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Liu, Jianping]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Yan, Yanfu]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 4 ] [Xia, Zhidong]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 5 ] [Lei, Yongping]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 6 ] [Guo, Fu]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 7 ] [Li, Xiaoyan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Shi, Yaowu]Beijing Univ Technol, Sch Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100022, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2008

Issue: 4

Volume: 37

Page: 507-514

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 38

SCOPUS Cited Count: 45

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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