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Author:

Han, Fenglin (Han, Fenglin.) | Jiang, Zhuqing (Jiang, Zhuqing.) (Scholars:江竹青) | Jia, Yanyan (Jia, Yanyan.) | Liu, Yiwei (Liu, Yiwei.)

Indexed by:

CPCI-S EI Scopus

Abstract:

A method for measuring the channel size of microfluidic chip by using optical coherence tomography (OCT) is investigated. Based on spectral-domain OCT imaging and image processing, an OCT system for measurement of the microfluidic channel size is developed, which is suitable for planar two-dimensional measurement. The cross-sectional images of the micro-channel of a microfluidic chip are obtained by using OCT continuous B-scan technology. With image processing for the acquired image in noise elimination and dispersion compensation, the size of the micro-channels in depth is achieved. Comparing with the single-scan OCT imaging mode, back-passing multiple-scans mode has the capability of high image quality to achieve high measurement precision of micro-channel size.

Keyword:

tomographic imaging microfluidic chip depth measurement optical coherence tomography dispersion compensation

Author Community:

  • [ 1 ] [Han, Fenglin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Jiang, Zhuqing]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Jia, Yanyan]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Yiwei]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Han, Fenglin]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Jiang, Zhuqing]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Jia, Yanyan]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Liu, Yiwei]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 江竹青

    [Jiang, Zhuqing]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China;;[Jiang, Zhuqing]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China

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Source :

ADVANCED OPTICAL IMAGING TECHNOLOGIES

ISSN: 0277-786X

Year: 2018

Volume: 10816

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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