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Author:

Gao, Peng (Gao, Peng.) | Lin, Jian (Lin, Jian.) | Lei, Yongping (Lei, Yongping.) (Scholars:雷永平) | Wen, Guichen (Wen, Guichen.)

Indexed by:

CPCI-S

Abstract:

With the introduction of relevant laws and regulations in many countries, the electronic industry around the global has switched into lead-free age because of the harm of lead in solder on the environment and human health,. SnAgCu based solder is the most popular lead-free solder recently. The solder joint reliability has become an increasingly problem due to the change of packaging materials and packaging process. In this study, the drop reliability of lead-free solder joint, including Sn3.0Ag0.5Cu (SAC305), Sn1.0Ag0.5Cu (SAC105) and Sn0.3Ag0.7Cu (SAC0307) was studied. It can be seen that with the Ag content increasing, the thickness of the intermetallic compound layer increased. Meanwhile, the intermetallic compound particles inside the solder become smaller and the number of particles has increased. Thus with the Ag content increasing, the tensile strength of solder joint could be improved. Under dropping load, all the fracture surfaces are relatively bright and smooth. That meant that all the fracture of solder joints was brittle. With the Ag content increasing, the impact performance was: SAC0307>SAC105>SAC305.

Keyword:

drop performance intermetallic compound (IMC) layer lead-free solder joint silver content

Author Community:

  • [ 1 ] [Gao, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 2 ] [Lin, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 3 ] [Lei, Yongping]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 4 ] [Wen, Guichen]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

Reprint Author's Address:

  • [Gao, Peng]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

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Source :

2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

Year: 2013

Page: 809-813

Language: English

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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